On 23 August, Prof. Lu-Tao WENG from the Hong Kong University of Science and Technology, was invited to give a talk entitled ” The Applications of Time-of-Flight Secondary Ion Mass Spectrometry in Materials Science”. At the seminar, Prof. Weng focused on the applications of TOF-SIMS in materials science using typical examples performed at HKUST. Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a unique surface analysis technique that provides spatially resolved elemental, chemical and molecular composition of the surface of all kinds of solid materials. It is also capable of depth profiling, providing the same information below the surface.
Prof. Lu-Tao WENG is currently a chief scientist in the Materials Characterization and Preparation Facility (MCPF) and an adjunct professor in the Department of Chemical and Biological Engineering (CBE) of the Hong Kong University of Science and Technology (HKUST). He received his B.S. from East China University of Science and Technology in China, and completed his PhD in materials science at the Catholic University of Louvain in Belgium. His primary research interests include surface and interface analysis of advanced materials using XPS, TOF-SIMS, dynamic SIMS, AFM, contact angle measurements etc. Overall, he has published 3 book chapters, 7 review papers and over 120 articles in peer-reviewed journals. As a surface analysis expert, he has often delivered invited talks in international conferences. He is actually the representative from greater China in the organizing committee of international SIMS conferences.
